| ITC Program Committee Topic Assignments | ||
|---|---|---|
| Topic Responsibility |
Name |
|
|
|
Benoit Nadeau-Dostie |
benoit_nadeau-dostie_A+T_mentor.com |
|
|
Francois-Fabien Ferhani |
fferhani_A+T_broadcom.com |
|
- Program Chair |
Erik Volkerink |
erik.volkerink_A+T_verigy.com |
|
- Program Vice Chair |
Shawn Blanton |
blanton_A+T_ece.cmu.edu |
|
ATC - Analog/Mixed-Signal, RF |
Stephen Sunter |
stephen_sunter_A+T_mentor.com |
|
ATC - ATE Hardware/Software |
Ben Brown |
benjamin_brown_A+T_ltx-credence.com |
|
ATC - ATPG and Fault Simulation |
Brion Keller |
kellerbl_A+T_cadence.com |
|
ATC - Board and System |
Kenneth Parker |
kenneth_parker_A+T_agilent.com |
|
ATC - DFM, Diagnosis, IDDQ, MEMs |
Anne Gattiker |
gattiker_A+T_us.ibm.com |
|
ATC - DFT,Case Studies,Economics,Stds |
Xinli Gu |
xgu_A+T_cisco.com |
|
ATC - DFT,Case Studies,Economics,Stds |
Rajesh Raina |
rajesh.raina_A+T_freescale.com |
|
ATC - Lecture Series, Adv Ind Practice |
Robert Aitken |
rob.aitken_A+T_arm.com |
|
ATC - Memory, FPGA, Emerging Topics |
Cheng-Wen Wu |
cww_A+T_ee.nthu.edu.tw |
|
ATC - Microprocessor, SOC, On-Line Test |
Mary Kusko |
eleve_A+T_us.ibm.com |
|
ATC - Pre and Post Silicon Validation |
Subhasish Mitra |
subh_A+T_stanford.edu |
|
ATE Hardware |
Jim O Reilly |
jim_oreilly_A+T_ieee.org |
|
ATE Hardware |
Ben Brown |
benjamin_brown_A+T_ltx-credence.com |
|
ATE Hardware |
Dennis Conti |
dconti_A+T_us.ibm.com |
|
ATE Software |
Erik Volkerink |
erik.volkerink_A+T_verigy.com |
|
ATE Software |
Art Downey |
artdowney_A+T_cruzio.com |
|
ATE Software |
Ralf Arnold |
ralf.arnold_A+T_infineon.com |
|
ATPG - Design Validation |
Prab Varma |
prab_A+T_bluepearlsoftware.com |
|
ATPG and Fault Simulation |
Xiaoqing Wen |
wen_A+T_cse.kyutech.ac.jp |
|
ATPG and Fault Simulation |
Li-C. Wang |
licwang_A+T_ece.ucsb.edu |
|
ATPG and Fault Simulation |
Michael Hsiao |
mhsiao_A+T_vt.edu |
|
ATPG and Fault Simulation |
Mark Kassab |
mark_kassab_A+T_mentor.com |
|
ATPG and Fault Simulation |
Brion Keller |
kellerbl_A+T_cadence.com |
|
ATPG and Fault Simulation |
Jayashree Saxena |
j-saxena_A+T_ti.com |
|
Board - System Test |
Anthony Ambler |
ambler_A+T_ece.utexas.edu |
|
Board Test |
Chen-huan Chiang |
chen-huan.chiang_A+T_alcatel-lucent.com |
|
Board Test |
Kenneth Parker |
kenneth_parker_A+T_agilent.com |
|
Board Test |
James Grealish |
james.grealish_A+T_intel.com |
|
Corporate Presentations |
Erik Volkerink |
erik.volkerink_A+T_verigy.com |
|
Design-for-Test |
Bruce Cory |
bcory_A+T_nvidia.com |
|
Design-for-Test |
Janusz Rajski |
janusz_rajski_A+T_mentor.com |
|
Design-for-Test |
Kazumi Hatayama |
hatayama.kazumi_A+T_starc.or.jp |
|
Design-for-Test |
Patrick Girard |
girard_A+T_lirmm.fr |
|
Design-for-Test |
Grady Giles |
grady.giles_A+T_amd.com |
|
Design-for-Test |
Rubin Parekhji |
parekhji_A+T_ti.com |
|
Design-for-Test |
Jerzy Tyszer |
tyszer_A+T_et.put.poznan.pl |
|
Design-for-Test |
Rajesh Raina |
rajesh.raina_A+T_freescale.com |
|
Design-for-Test |
Vivek Chickermane |
vivekc_A+T_cadence.com |
|
Design-for-Test - Economics |
Magdy Abadir |
m.abadir_A+T_freescale.com |
|
Design-for-Test - Standards |
Rohit Kapur |
rkapur_A+T_synopsys.com |
|
DFM - MEMs Testing |
Shawn Blanton |
blanton_A+T_ece.cmu.edu |
|
DFM - MEMs Testing |
Krishnendu Chakrabarty |
krish_A+T_ee.duke.edu |
|
DFM, Defects, Diag, FA, and IDDQ |
Jaume Segura |
jaume.segura_A+T_uib.es |
|
DFM, Defects, Diag, FA, and IDDQ |
Anjali Vij |
anjali_A+T_geninf.com |
|
DFM, Defects, Diag, FA, and IDDQ |
Anne Gattiker |
gattiker_A+T_us.ibm.com |
|
DFM, Defects, Diag, FA, and IDDQ |
Srikanth Venkataraman |
srikanth.venkataraman_A+T_intel.com |
|
DFM, Defects, Diag, FA, and IDDQ |
Jerry Soden |
sodenjm_A+T_sandia.gov |
|
DFM, Defects, Diag, FA, and IDDQ |
James Plusquellic |
jimp_A+T_ece.unm.edu |
|
DFM, Defects, Diag, FA, and IDDQ |
Shawn Blanton |
blanton_A+T_ece.cmu.edu |
|
DFM, Defects, Diag, FA, and IDDQ |
Stefan Eichenberger |
Stefan.Eichenberger_A+T_nxp.com |
|
Lectures - Advanced Industrial Practice |
Robert Aitken |
rob.aitken_A+T_arm.com |
|
Lectures - Advanced Industrial Practice |
Jeff Rearick |
jeff.rearick_A+T_amd.com |
|
Lectures - Advanced Industrial Practice |
Laung-Terng Wang |
wang_A+T_syntest.com |
|
Lectures - Advanced Industrial Practice |
Anuja Sehgal |
abanerjee_A+T_nvidia.com |
|
Lectures - Advanced Industrial Practice |
Rajesh Galivanche |
rajesh.galivanche_A+T_intel.com |
|
Memory Test |
Charles Stroud |
cestroud_A+T_eng.auburn.edu |
|
Memory Test |
Mehdi Tahoori |
mehdi.tahoori_A+T_kit.edu |
|
Memory Test |
Yervant Zorian |
zorian_A+T_viragelogic.com |
|
Memory Test |
Nobuaki Otsuka |
nobuaki1.ootsuka_A+T_toshiba.co.jp |
|
Memory Test |
Michel Renovell |
renovell_A+T_lirmm.fr |
|
Microprocessor - On-Line Test |
Cecilia Metra |
cmetra_A+T_deis.unibo.it |
|
Microprocessor - SOC Test |
Erik Jan Marinissen |
erik.jan.marinissen_A+T_imec.be |
|
Microprocessor - Test Economics |
Scott Davidson |
scott.davidson_A+T_oracle.com |
|
Microprocessor Test |
Doug Josephson |
doug.josephson_A+T_intel.com |
|
Microprocessor Test |
Teresa McLaurin |
teresa.mclaurin_A+T_arm.com |
|
Microprocessor Test |
Nagesh Tamarapalli |
nagesh.tamarapalli_A+T_amd.com |
|
Microprocessor Test |
Ishwar Parulkar |
ishwar_parulkar_A+T_yahoo.com |
|
Microprocessor Test |
Mary Kusko |
eleve_A+T_us.ibm.com |
|
Mixed/Signal - RF |
Mustapha SLAMANI |
slamanim_A+T_us.ibm.com |
|
Mixed/Signal - RF |
Sule Ozev |
sule.ozev_A+T_asu.edu |
|
Mixed-Signal/Analog |
Abhijit Chatterjee |
chat_A+T_ece.gatech.edu |
|
Mixed-Signal/Analog |
Salvador Mir |
salvador.mir_A+T_imag.fr |
|
Mixed-Signal/Analog |
Stephen Sunter |
stephen_sunter_A+T_mentor.com |
|
Mixed-Signal/Analog |
Mani Soma |
manisoma_A+T_uw.edu |
|
Mixed-Signal/Analog |
Gordon Roberts |
gordon.roberts_A+T_mcgill.ca |
|
Panels |
Carol Pyron |
Carol.Pyron_A+T_freescale.com |
|
Panels |
Rohit Kapur |
rkapur_A+T_synopsys.com |
|
Post Silicon Validation |
Tim Cheng |
timcheng_A+T_ece.ucsb.edu |
|
Post Silicon Validation |
Doug Josephson |
doug.josephson_A+T_intel.com |
|
Post Silicon Validation |
Prab Varma |
prab_A+T_bluepearlsoftware.com |
|
Pre Silicon Verification |
Prab Varma |
prab_A+T_bluepearlsoftware.com |
|
Pre Silicon Verification |
Tim Cheng |
timcheng_A+T_ece.ucsb.edu |
|
Test Compression/ Logic BIST |
Janusz Rajski |
janusz_rajski_A+T_mentor.com |
|
Test Compression/ Logic BIST |
Kazumi Hatayama |
hatayama.kazumi_A+T_starc.or.jp |
|
Test Compression/ Logic BIST |
Rubin Parekhji |
parekhji_A+T_ti.com |
|
Test Compression/ Logic BIST |
Jerzy Tyszer |
tyszer_A+T_et.put.poznan.pl |
|
Test Compression/ Logic BIST |
Vivek Chickermane |
vivekc_A+T_cadence.com |
|
Asian Subcommittee |
Yoshiaki Asao |
yoshiaki.asao_A+T_toshiba.co.jp |
|
Asian Subcommittee |
Kazumi Hatayama |
hatayama.kazumi_A+T_starc.or.jp |
|
Asian Subcommittee |
Tsutomu Takenaka |
Tsutomu.Takenaka_A+T_jp.yokogawa.com |
|
Asian Subcommittee |
Nobuaki Otsuka |
nobuaki1.ootsuka_A+T_toshiba.co.jp |
|
Asian Subcommittee Chair |
Hidetoshi Nagura |
Hidetoshi.Nagura_A+T_jp.yokogawa.com |
|
Asian Subcommittee Chair |
Yasuo Sato |
sato_A+T_aries30.cse.kyutech.ac.jp |
|
European Sucommittee Chair |
Patrick Girard |
girard_A+T_lirmm.fr |
|
ITC Office Coordinator |
Lauren Deaton |
ldeaton_A+T_courtesyassoc.com |
|
ITC Office Coordinator |
Tonya Freeland |
itc_A+T_courtesyassoc.com |
|
Past Program Chair |
William Eklow |
beklow_A+T_cisco.com |
|
Past Program Chair |
Janusz Rajski |
janusz_rajski_A+T_mentor.com |
|
Past Program Chair |
Anne Gattiker |
gattiker_A+T_us.ibm.com |
|
Past Program Chair |
Donald Wheater |
dwheater_A+T_ieee.org |
|
Past Program Chair |
Kenneth Butler |
kenb_A+T_ti.com |
|
Past Program Chair |
Nur Touba |
touba_A+T_ece.utexas.edu |
|
Presentation Coordinator |
Art Downey |
artdowney_A+T_cruzio.com |
|
Presentation Coordinator |
Erik Volkerink |
erik.volkerink_A+T_verigy.com |
|
Program Chair Emeritus Advisor |
Scott Davidson |
scott.davidson_A+T_oracle.com |
|
VLSI Test Symposium Liaison |
Yervant Zorian |
zorian_A+T_viragelogic.com |
|
Web Site Coordinator |
Anjali Vij |
anjali_A+T_geninf.com |
|
Web Site Coordinator |
Burnell West |
west_A+T_ieee.org |
