| ITC Program Committee Topic Assignments | |
|---|---|
| Topic Responsibility |
Name |
|
|
Benoit Nadeau-Dostie |
|
- Program Chair |
William Eklow |
|
- Program Vice Chair |
Erik Volkerink |
|
ATC - Analog/Mixed-Signal, RF |
Stephen Sunter |
|
ATC - ATE Hardware/Software |
Ben Brown |
|
ATC - ATPG and Fault Simulation |
Brion Keller |
|
ATC - Board and System |
Kenneth Parker |
|
ATC - DFM, Diagnosis, IDDQ, MEMs |
Anne Gattiker |
|
ATC - DFT,Case Studies,Economics,Stds |
Rajesh Raina |
|
ATC - Lecture Series, Adv Ind Practice |
Robert Aitken |
|
ATC - Memory, FPGA |
Rochit Rajsuman |
|
ATC - Microprocessor, SOC, On-Line Test |
Mary Kusko |
|
ATC - Test Compression/LBIST |
Xinli Gu |
|
ATE Hardware |
Ben Brown |
|
ATE Hardware |
Dennis Conti |
|
ATE Hardware |
Jim O Reilly |
|
ATE Software |
Ralf Arnold |
|
ATE Software |
Art Downey |
|
ATE Software |
Erik Volkerink |
|
ATPG - Design Validation |
Prab Varma |
|
ATPG and Fault Simulation |
Brion Keller |
|
ATPG and Fault Simulation |
Li-C. Wang |
|
ATPG and Fault Simulation |
Michael Hsiao |
|
ATPG and Fault Simulation |
Mark Kassab |
|
ATPG and Fault Simulation |
Xiaoqing Wen |
|
ATPG and Fault Simulation |
Jayashree Saxena |
|
Board - System Test |
Anthony Ambler |
|
Board - System Test |
Xinli Gu |
|
Board Test |
Chen-huan Chiang |
|
Board Test |
Kenneth Parker |
|
Board Test |
James Grealish |
|
Corporate Presentations |
Erik Volkerink |
|
Design-for-Test |
Patrick Girard |
|
Design-for-Test |
Grady Giles |
|
Design-for-Test |
Rajesh Raina |
|
Design-for-Test |
Bruce Cory |
|
Design-for-Test - Economics |
Anthony Ambler |
|
Design-for-Test - Economics |
Scott Davidson |
|
Design-for-Test - Economics |
Magdy Abadir |
|
Design-for-Test - Standards |
Rohit Kapur |
|
DFM - MEMs Testing |
Krishnendu Chakrabarty |
|
DFM - MEMs Testing |
Shawn Blanton |
|
DFM, Defects, Diag, FA, and IDDQ |
Anjali Vij |
|
DFM, Defects, Diag, FA, and IDDQ |
Anne Gattiker |
|
DFM, Defects, Diag, FA, and IDDQ |
Jaume Segura |
|
DFM, Defects, Diag, FA, and IDDQ |
Jerry Soden |
|
DFM, Defects, Diag, FA, and IDDQ |
Srikanth Venkataraman |
|
DFM, Defects, Diag, FA, and IDDQ |
James Plusquellic |
|
DFM, Defects, Diag, FA, and IDDQ |
Shawn Blanton |
|
DFM, Defects, Diag, FA, and IDDQ |
Stefan Eichenberger |
|
Lectures - Advanced Industrial Practice |
Laung-Terng Wang |
|
Lectures - Advanced Industrial Practice |
Rajesh Galivanche |
|
Lectures - Advanced Industrial Practice |
Subhasish Mitra |
|
Lectures - Advanced Industrial Practice |
Jeff Rearick |
|
Lectures - Advanced Industrial Practice |
Robert Aitken |
|
Memory Test |
Charles Stroud |
|
Memory Test |
Rochit Rajsuman |
|
Memory Test |
Yervant Zorian |
|
Memory Test |
Michel Renovell |
|
Microprocessor - On-Line Test |
Cecilia Metra |
|
Microprocessor - On-Line Test |
Subhasish Mitra |
|
Microprocessor - SOC Test |
Erik Jan Marinissen |
|
Microprocessor Test |
Doug Josephson |
|
Microprocessor Test |
Teresa McLaurin |
|
Microprocessor Test |
Ishwar Parulkar |
|
Microprocessor Test |
Nagesh Tamarapalli |
|
Microprocessor Test |
Mary Kusko |
|
Mixed/Signal - RF |
Sule Ozev |
|
Mixed/Signal - RF |
Mustapha SLAMANI |
|
Mixed-Signal/Analog |
Abhijit Chatterjee |
|
Mixed-Signal/Analog |
Salvador Mir |
|
Mixed-Signal/Analog |
Stephen Sunter |
|
Mixed-Signal/Analog |
Mani Soma |
|
Mixed-Signal/Analog |
Gordon Roberts |
|
Panels |
Carol Pyron |
|
Panels |
Rohit Kapur |
|
Test Compression/ Logic BIST |
Kazumi Hatayama |
|
Test Compression/ Logic BIST |
Vivek Chickermane |
|
Test Compression/ Logic BIST |
Xinli Gu |
|
Test Compression/ Logic BIST |
Jerzy Tyszer |
|
Test Compression/ Logic BIST |
Rubin Parekhji |
|
Test Compression/ Logic BIST |
Janusz Rajski |
|
Asian Subcommittee |
Kazumi Hatayama |
|
Asian Subcommittee Chair |
Yoshiaki Asao |
|
European Sucommittee Chair |
Patrick Girard |
|
ITC Office Coordinator |
Lauren Deaton |
|
ITC Office Coordinator |
Tonya Freeland |
|
Past Program Chair |
Anne Gattiker |
|
Past Program Chair |
Nur Touba |
|
Past Program Chair |
Kenneth Butler |
|
Past Program Chair |
Janusz Rajski |
|
Presentation Coordinator |
Art Downey |
|
Presentation Coordinator |
Erik Volkerink |
|
Program Chair Emeritus Advisor |
Scott Davidson |
|
VLSI Test Symposium Liaison |
Yervant Zorian |
|
Web Site Coordinator |
Anjali Vij |
|
Web Site Coordinator |
Donald Wheater |
|
Web Site Coordinator |
Burnell West |
